| Category: | Spektrometer |
| Location: | Institut für Geowissenschaften |
| Group: | Scanning Electron Microscopy Laboratory for Geomaterials |
| URL: | https://www.geow.uni-heidelberg.de/en/facilities/electron-microscopy |
| Contact: | Prof. Rojas-Agramonte activate javascript to see email address |
| Funded by: | partially by FoF2 |
| Technical Information: | JEOL FEG-SEM JSM-IT800 equipped with: In-lens Schottky emitter (FEG) Electron Backscatter Diffraction (EBSD) detector (Oxford Instruments, Symmetry 2) Energy Dispersive Spectroscopy (EDS) system (Oxford Instruments, Ultim Max 100 mm²) High vacuum SE and 6-sector BSE detectors Low-vacuum system (with SE and BSE detectors) Eucentric 5-axes stage (x / y / z / tilt / rotate) Sample size up to 100*100*50 mm |
